— We present a probabilistic fault model that allows any number of gates in an integrated circuit to fail probabilistically. Tests for this fault model, determined using the theo...
Zhanglei Wang, Krishnendu Chakrabarty, Michael G&o...
In this paper, we propose a geometric approach to the theory of evidence based on convex geometric interpretations of its two key notions of belief function (b.f.) and Dempster...
A generic theoretical framework for managing critical events in ubiquitous computing systems is presented. The main idea is to automatically respond to occurrences of critical eve...
Tridib Mukherjee, Krishna M. Venkatasubramanian, S...
—Event-Driven Software (EDS) can change state based on incoming events; common examples are GUI and web applications. These EDS pose a challenge to testing because there are a la...
We present a hybrid method to turn off-the-shelf information retrieval (IR) systems into future event predictors. Given a query, a time series model is trained on the publication...