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» Process Diagnostics: A Method Based on Process Mining
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VTS
2000
IEEE
114views Hardware» more  VTS 2000»
15 years 9 months ago
Detection of CMOS Defects under Variable Processing Conditions
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
Amy Germida, James F. Plusquellic
ECCV
2008
Springer
16 years 6 months ago
Online Sparse Matrix Gaussian Process Regression and Vision Applications
We present a new Gaussian Process inference algorithm, called Online Sparse Matrix Gaussian Processes (OSMGP), and demonstrate its merits with a few vision applications. The OSMGP ...
Ananth Ranganathan, Ming-Hsuan Yang
ICIP
2003
IEEE
16 years 6 months ago
Design of Q-shift complex wavelets for image processing using frequency domain energy minimization
This paper proposes a new method of designing finitesupport wavelet filters, based on minimization of energy in key parts of the frequency domain. In particular this technique is ...
Nick G. Kingsbury
ICDE
2008
IEEE
165views Database» more  ICDE 2008»
16 years 6 months ago
Online Failure Forecast for Fault-Tolerant Data Stream Processing
In this paper, we present a new online failure forecast system to achieve predictive failure management for fault-tolerant data stream processing. Different from previous reactive ...
Xiaohui Gu, Spiros Papadimitriou, Philip S. Yu, Sh...
SLIP
2009
ACM
15 years 11 months ago
Closed-form solution for timing analysis of process variations on SWCNT interconnect
In this paper, a comprehensive and fast method is presented for the timing analysis of process variations on single-walled carbon nanotube (SWCNT) bundles. Unlike previous works t...
Peng Sun, Rong Luo