193 search results - page 4 / 39 » Process Diagnostics |
DATE
2008
IEEE
15 years 4 months ago
2008
IEEE
– A new approach for diagnostic analysis of static errors in multi-step ADC based on the steepestdescent method is proposed. To set initial data, estimate the parameter update an...
DFT
2008
IEEE
15 years 4 months ago
2008
IEEE
Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capabilit...
KDD
2004
ACM
15 years 2 months ago
2004
ACM
World steel trade becomes more competitive every day and new high international quality standards and productivity levels can only be achieved by applying the latest computational...
CORR
2008
Springer
14 years 9 months ago
2008
Springer
Abstract. This paper presents a novel technique for counterexample generation in probabilistic model checking of Markov chains and Markov Decision Processes. (Finite) paths in coun...
TSMC
2010
14 years 4 months ago
2010
Abstract--It is critical to use automated generators for synthetic models and data, given the sparsity of benchmark models for empirical analysis and the cost of generating models ...