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115
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DFT
2006
IEEE
15 years 8 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
221
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Book
"This manual provides an introduction to the GNU C and C++ Compilers, gcc and g++, which are part of the GNU Compiler Collection (GCC)."
110
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PPPJ
2009
ACM
15 years 9 months ago
2009
ACM
In test-driven development, tests are written for each program unit before the code is written, ensuring that the code has a comprehensive unit testing harness. Unfortunately, uni...
104
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DSN
2007
IEEE
15 years 8 months ago
2007
IEEE
A new approach is proposed that exploits repetition inherent in programs to provide low-overhead transient fault protection in a processor. Programs repeatedly execute the same in...
126
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LOPSTR
1994
Springer
15 years 6 months ago
1994
Springer
The unfold/fold transformation system defined by Tamaki and Sato was meant for definite programs. It transforms a program into an equivalent one in the sense of both the least tter...