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DAC
2005
ACM
16 years 5 months ago
StressTest: an automatic approach to test generation via activity monitors
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
Ilya Wagner, Valeria Bertacco, Todd M. Austin
DAC
2006
ACM
16 years 5 months ago
High-level power management of embedded systems with application-specific energy cost functions
Most existing dynamic voltage scaling (DVS) schemes for multiple tasks assume an energy cost function (energy consumption versus execution time) that is independent of the task ch...
Youngjin Cho, Naehyuck Chang, Chaitali Chakrabarti...
DAC
2006
ACM
16 years 5 months ago
Fast algorithms for slew constrained minimum cost buffering
As a prevalent constraint, sharp slew rate is often required in circuit design which causes a huge demand for buffering resources. This problem requires ultra-fast buffering techn...
Shiyan Hu, Charles J. Alpert, Jiang Hu, Shrirang K...
SIGSOFT
2009
ACM
16 years 5 months ago
Improving bug triage with bug tossing graphs
A bug report is typically assigned to a single developer who is then responsible for fixing the bug. In Mozilla and Eclipse, between 37%-44% of bug reports are "tossed" ...
Gaeul Jeong, Sunghun Kim, Thomas Zimmermann
SIGSOFT
2007
ACM
16 years 5 months ago
Detection and resolution of atomicity violation in service composition
Atomicity is a desirable property that safeguards application consistency for service compositions. A service composition exhibiting this property could either complete or cancel ...
Chunyang Ye, S. C. Cheung, W. K. Chan, Chang Xu
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