10715 search results - page 116 / 2143 » Proofs from Tests |
87
Voted
CCCG
2008
15 years 2 months ago
2008
We give a very short proof of the following result of Graham from 1980: For any finite coloring of Rd , d 2, and for any > 0, there is a monochromatic (d + 1)-tuple that span...
87
Voted
APAL
2005
15 years 18 days ago
2005
We prove a full completeness theorem for multiplicative-additive linear logic (i.e. MALL) using a double gluing construction applied to Ehrhard's -autonomous category of hype...
128
Voted
DAC
2005
ACM
16 years 1 months ago
2005
ACM
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
97
Voted
DATE
2008
IEEE
15 years 7 months ago
2008
IEEE
The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the...
97
Voted
DDECS
2007
IEEE
15 years 7 months ago
2007
IEEE
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...