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DSN
2007
IEEE
15 years 4 months ago
2007
IEEE
Testing is a difficult process that becomes more difficult with scaling. With smaller and faster devices, tolerance for errors shrinks and devices may act correctly under certain ...
ICNP
2000
IEEE
15 years 2 months ago
2000
IEEE
Instead of the increase-by-onedecrease-to-halfstrategy used in TCP Reno for congestion window adjustment, we consider the general case such that the increase value and decrease ra...
DAC
1996
ACM
15 years 2 months ago
1996
ACM
1- A methodology is presented in this paper for determining an optimal set of clock path delays for designing high performance VLSI/ULSI-based clock distribution networks. This met...
APNOMS
2006
Springer
15 years 1 months ago
2006
Springer
Abstract. Recently, researchers have explored to provide a queue management scheme with differentiated loss guarantees for the future Internet. The Bounded Random Drop (BRD), known...
DAC
2011
ACM
13 years 9 months ago
2011
ACM
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...