287 search results - page 26 / 58 » Reducing Power in High-Performance Microprocessors |
ASPDAC
2001
ACM
15 years 1 months ago
2001
ACM
Our earlier work for fast evaluation of power consumption of general cores in a system-on-a-chip described techniques that involved isolating high-level instructions of a core, me...
MICRO
2008
IEEE
15 years 4 months ago
2008
IEEE
—Negative bias temperature instability (NBTI), which reduces the lifetime of PMOS transistors, is becoming a growing reliability concern for sub-micrometer CMOS technologies. Par...
MICRO
2006
IEEE
15 years 3 months ago
2006
IEEE
Power delivery is a growing reliability concern in microprocessors as the industry moves toward feature-rich, powerhungrier designs. To battle the ever-aggravating power consumpti...
70
Voted
DAC
2008
ACM
15 years 10 months ago
2008
ACM
Technological advances enable modern processors to utilize increasingly larger DRAMs with rising access frequencies. This is leading to high power consumption and operating temper...
IEEEPACT
2006
IEEE
15 years 3 months ago
2006
IEEE
With reducing feature size, increasing chip capacity, and increasing clock speed, microprocessors are becoming increasingly susceptible to transient (soft) errors. Redundant multi...