Reductions that aggregate fine-grained transitions into coarser transitions can significantly reduce the cost of automated verification, by reducing the size of the state space. W...
Finding latent patterns in high dimensional data is an important research problem with numerous applications. The most well known approaches for high dimensional data analysis are...
A method is introduced for model order reduction of large circuits extracted from layout. The algorithm, which is based on balanced realization, can be used for reducing the order ...
Specification reduction can reduce test time, consequently, test cost. In this paper, a methodology to reduce specifications during specification testing for analog circuit is prop...
Abstract-- In this paper, a technique that can efficiently reduce peak and average switching activity during test application is proposed. The proposed method does not require any ...