167 search results - page 33 / 34 » Robust Techniques for Watermarking Sequential Circuit Design... |
IOLTS
2006
IEEE
14 years 9 days ago
2006
IEEE
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
ICCD
2008
IEEE
14 years 3 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
ISPD
2007
ACM
13 years 7 months ago
2007
ACM
When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...
IPPS
2010
IEEE
13 years 4 months ago
2010
IEEE
Abstract--The lag of parallel programming models and languages behind the advance of heterogeneous many-core processors has left a gap between the computational capability of moder...
TSMC
2008
13 years 6 months ago
2008
This paper proposes a type-2 self-organizing neural fuzzy system (T2SONFS) and its hardware implementation. The antecedent parts in each T2SONFS fuzzy rule are interval type-2 fuzz...