768 search results - page 26 / 154 » Robustness of Sequential Circuits |
120
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DATE
2003
IEEE
15 years 9 months ago
2003
IEEE
This paper presents a new and low-cost approach for identifying sequentially untestable faults. Unlike the single fault theorem, where the stuck-at fault is injected only in the r...
129
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MTV
2007
IEEE
15 years 10 months ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
106
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NECO
2008
15 years 4 months ago
2008
A new gradient technique is introduced for linear ICA based on the Edgeworth expansion of mutual information, for which the algorithm operates sequentially using fixed-point itera...
122
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PAMI
2008
15 years 4 months ago
2008
This paper describes a method for robust real time pattern matching. We first introduce a family of image distance measures, the "Image Hamming Distance Family". Members ...
104
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DAC
2009
ACM
15 years 11 months ago
2009
ACM
This paper proposes an equation-based multi-scenario iterative robust optimization methodology for analog/mixed-signal circuits. We show that due to local circuit performance mono...