103 search results - page 17 / 21 » SEU tolerant device, circuit and processor design |
DAC
2006
ACM
15 years 10 months ago
2006
ACM
Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vul...
MOBISYS
2008
ACM
15 years 9 months ago
2008
ACM
Many people desire ubiquitous access to their personal computing environments. We present a system in which a user leverages a personal mobile device to establish trust in a publi...
104
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TVLSI
2008
14 years 9 months ago
2008
As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance o...
113
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ISCA
2012
IEEE
13 years 4 days ago
2012
IEEE
The reliability of future processors is threatened by decreasing transistor robustness. Current architectures focus on delivering high performance at low cost; lifetime device rel...
140
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ISCA
2012
IEEE
13 years 4 days ago
2012
IEEE
A significant portion of the energy dissipated in modern integrated circuits is consumed by the overhead associated with timing guardbands that ensure reliable execution. Timing ...