518 search results - page 24 / 104 » SMDS Measurements and Modeling to Predict Performance |
DAC
2007
ACM
15 years 10 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
WWW
2009
ACM
15 years 4 months ago
2009
ACM
In the past, some researches suggested that engineers can use combined software reliability growth models (SRGMs) to obtain more accurate reliability prediction during testing. In...
ECCV
2010
Springer
15 years 3 months ago
2010
Springer
Abstract. We present a discriminatively trained model for joint modelling of object class labels (e.g. “person”, “dog”, “chair”, etc.) and their visual attributes (e.g....
ISLPED
2004
ACM
15 years 3 months ago
2004
ACM
Mobile, battery-powered devices such as personal digital assistants and web-enabled mobile phones have successfully emerged as new access points to the world’s digital infrastru...
IPPS
2007
IEEE
15 years 4 months ago
2007
IEEE
This paper explores the correlation of instruction counts and cache misses to runtime performance for a large family of divide and conquer algorithms to compute the Walsh–Hadama...