As the amount of information technology increases, managing information resources, so that the correct people can find the information easily, becomes a critical issue. Hypermedia...
Ian Heath, Gary Wills, Richard Crowder, Wendy Hall...
It is widely accepted that transient failures will appear more frequently in chips designed in the near future due to several factors such as the increased integration scale. On th...
Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Large SRAM structures used for caches are particularly ...
Amin Ansari, Shantanu Gupta, Shuguang Feng, Scott ...
Evolving technology and increasing pin-bandwidth motivate the use of high-radix routers to reduce the diameter, latency, and cost of interconnection networks. High-radix networks,...
John Kim, William J. Dally, Steve Scott, Dennis Ab...
It is widely recognized that device and interconnect fabrics at the nanoscale will be characterized by an increased susceptibility to transient faults. This appears to be intrinsi...