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ISCA
2010
IEEE
199views Hardware» more  ISCA 2010»
15 years 3 months ago
Use ECP, not ECC, for hard failures in resistive memories
As leakage and other charge storage limitations begin to impair the scalability of DRAM, non-volatile resistive memories are being developed as a potential replacement. Unfortunat...
Stuart E. Schechter, Gabriel H. Loh, Karin Straus,...
CF
2007
ACM
15 years 3 months ago
Parallel genomic sequence-search on a massively parallel system
In the life sciences, genomic databases for sequence search have been growing exponentially in size. As a result, faster sequencesearch algorithms to search these databases contin...
Oystein Thorsen, Brian E. Smith, Carlos P. Sosa, K...
DATE
2009
IEEE
171views Hardware» more  DATE 2009»
15 years 3 months ago
Physically clustered forward body biasing for variability compensation in nanometer CMOS design
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse consequences on design predictability and yield. A number of recent works have...
Ashoka Visweswara Sathanur, Antonio Pullini, Luca ...
GLVLSI
2009
IEEE
143views VLSI» more  GLVLSI 2009»
15 years 3 months ago
Unified P4 (power-performance-process-parasitic) fast optimization of a Nano-CMOS VCO
In this paper, we present the design of a P4 (Power-PerformanceProcess-Parasitic) aware voltage controlled oscillator (VCO) at nanoCMOS technologies. Through simulations, we have ...
Dhruva Ghai, Saraju P. Mohanty, Elias Kougianos
GECCO
2006
Springer
210views Optimization» more  GECCO 2006»
15 years 3 months ago
Clustering the heap in multi-threaded applications for improved garbage collection
Garbage collection can be a performance bottleneck in large distributed, multi-threaded applications. Applications may produce millions of objects during their lifetimes and may i...
Myra B. Cohen, Shiu Beng Kooi, Witawas Srisa-an