12 search results - page 2 / 3 » Scan-Based BIST Diagnosis Using an Embedded Processor |
CSREAESA
2009
13 years 7 months ago
2009
Two embedded processor based fault injection case studies are presented which are applicable to Field Programmable Gate Arrays (FPGAs) and FPGA cores in configurable System-on-Chip...
DAC
2000
ACM
14 years 7 months ago
2000
ACM
At-speed testing of GHz processors using external testers may not be technically and economically feasible. Hence, there is an emerging need for low-cost, high-quality self-test m...
IOLTS
2002
IEEE
13 years 11 months ago
2002
IEEE
This paper proposes a new solution for the diagnosis of faults into embedded RAMs, currently under evaluation within STMicroelectronics. The proposed scheme uses dedicated circuit...
DSN
2002
IEEE
13 years 11 months ago
2002
IEEE
—Advanced automotive control applications such as steer-by-wire are typically implemented as distributed systems comprising many embedded processors, sensors, and actuators inter...
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
This paper presents an attempt of using intelligent agents for testing and repairing a distributed system, whose elements may or may not have embedded BIST (Built-In Self-Test) an...