34 search results - page 2 / 7 » Selected failure mechanisms of modern power modules |
CASES
2006
ACM
14 years 6 days ago
2006
ACM
With advances in process technology, soft errors (SE) are becoming an increasingly critical design concern. Due to their large area and high density, caches are worst hit by soft ...
ISPD
2010
ACM
14 years 1 months ago
2010
ACM
NBTI (Negative Bias Temperature Instability) has emerged as the dominant failure mechanism for PMOS in nanometer IC designs. However, its impact on one of the most important compo...
GLOBECOM
2010
IEEE
13 years 4 months ago
2010
IEEE
Abstract--This paper addresses reliability of data dissemination applications when there are severe disruptions to the underlying physical infrastructure. Such massive simultaneous...
IPPS
2005
IEEE
13 years 12 months ago
2005
IEEE
Modern server farm and cluster sites consume large quantities of energy both to power and cool the machines in the site. At the same time, less power supply redundancy is offered ...
DAC
1996
ACM
13 years 10 months ago
1996
ACM
Hot-carrier eects and electromigration are the two important failure mechanisms that signi cantly impact the long-term reliability of high-density VLSI ICs. In this paper, we prese...