5 search results - page 1 / 1 » Semiconductor manufacturing process monitoring using built-i... |
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
Embedded memories are among the most widely used cores in current system-on-chip (SOC) implementations. Memory cores usually occupy a significant portion of the chip area, and do...
ITC
1998
IEEE
13 years 10 months ago
1998
IEEE
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
This paper presents an attempt of using intelligent agents for testing and repairing a distributed system, whose elements may or may not have embedded BIST (Built-In Self-Test) an...
DAC
2000
ACM
14 years 7 months ago
2000
ACM
At-speed testing of GHz processors using external testers may not be technically and economically feasible. Hence, there is an emerging need for low-cost, high-quality self-test m...
CODES
2010
IEEE
13 years 4 months ago
2010
IEEE
The impact of process variation in state of the art technology makes traditional (worst case) designs unnecessarily pessimistic, which translates to suboptimal designs in terms of...