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SLIP
2009
ACM
15 years 10 months ago
Is overlay error more important than interconnect variations in double patterning?
Double patterning lithography seems to be a prominent choice for 32nm and 22nm technologies. Double patterning lithography techniques require additional masks for a single interco...
Kwangok Jeong, Andrew B. Kahng, Rasit Onur Topalog...
AINA
2008
IEEE
15 years 10 months ago
Service-Orientation and Flexible Service Binding in Distributed Automation and Control Systems
An experimental study shows the feasibility of service-oriented architectures for industrial automation and control systems even with respect to lower, real-time dependent control...
Andre Pohl, Heiko Krumm, Felix Holland, Franz-Jose...
111
Voted
DSN
2008
IEEE
15 years 10 months ago
Analysis and solutions to issue queue process variation
The last few years have witnessed an unprecedented explosion in transistor densities. Diminutive feature sizes have enabled microprocessor designers to break the billion-transisto...
Niranjan Soundararajan, Aditya Yanamandra, Chrysos...
133
Voted
DSN
2008
IEEE
15 years 10 months ago
Using likely program invariants to detect hardware errors
In the near future, hardware is expected to become increasingly vulnerable to faults due to continuously decreasing feature size. Software-level symptoms have previously been used...
Swarup Kumar Sahoo, Man-Lap Li, Pradeep Ramachandr...
110
Voted
DSN
2008
IEEE
15 years 10 months ago
Automated duplicate detection for bug tracking systems
Bug tracking systems are important tools that guide the maintenance activities of software developers. The utility of these systems is hampered by an excessive number of duplicate...
Nicholas Jalbert, Westley Weimer