— A closed-form model for simulation and analysis of voltage transients caused by single-event upsets (SEUs) in logic circuits is described. A linear RC model, derived using a SP...
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
Wangqi Qiu, Xiang Lu, Zhuo Li, D. M. H. Walker, We...
In this paper, the Simulated Evolution algorithm (SimE) is engineered to solve the optimization problem of multi-objective VLSI netlist bi-partitioning. The multi-objective versio...
Sadiq M. Sait, Aiman H. El-Maleh, Rush H. Al-Abuji
This paper analyses alternatives for the parallelization of the Simulated Annealing algorithm when applied to the placement of modules in a VLSI circuit considering the use of PVM...
Accurate power estimation is essential for low power digital CMOS circuit design. Power dissipation is input pattern dependent. To obtain an accurate power estimate, a large input...
Chi-Ying Tsui, Radu Marculescu, Diana Marculescu, ...