27913 search results - page 536 / 5583 » Simulation |
211
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CA
2003
IEEE
15 years 10 months ago
2003
IEEE
This paper presents a model for studying the impact of individual agents characteristics in emergent groups, on the evacuation efficiency as a result of local interactions. We use...
139
Voted
CEC
2003
IEEE
15 years 10 months ago
2003
IEEE
In this paper, the use of Simulated Evolution (SimE) Algorithm in the design of digital logic circuits is proposed. SimE algorithm consists of three steps: evaluation, selection an...
118
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DATE
2003
IEEE
15 years 10 months ago
2003
IEEE
: Stresses are considered an integral part of any modern industrial DRAM test. This paper describes a novel method to optimize stresses for memory testing, using defect injection a...
81
Voted
DATE
2003
IEEE
15 years 10 months ago
2003
IEEE
To increase the bandwidth of high-performance intrasystem interconnections optical multimode waveguides can be used. Since the design procedure of optical interconnections has to ...
144
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DFT
2003
IEEE
15 years 10 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...