86 search results - page 9 / 18 » Slipstream Processors: Improving both Performance and Fault ... |
SBCCI
2004
ACM
15 years 7 months ago
2004
ACM
This paper proposes a test planning method capable of reusing available processors as test sources and sinks, and the on-chip network as the access mechanism for the test of cores...
164
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ISCA
2012
IEEE
13 years 4 months ago
2012
IEEE
The reliability of future processors is threatened by decreasing transistor robustness. Current architectures focus on delivering high performance at low cost; lifetime device rel...
114
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FPGA
2005
ACM
15 years 7 months ago
2005
ACM
FPGA-based designs are more susceptible to single-event upsets (SEUs) compared to ASIC designs. Soft error rate (SER) estimation is a crucial step in the design of soft error tole...
136
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ICCD
2003
IEEE
15 years 10 months ago
2003
IEEE
Continued advancements in fabrication technology and reductions in feature size create challenges in maintaining both manufacturing yield rates and long-term reliability of device...
107
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PVLDB
2008
15 years 1 months ago
2008
Enterprises may use a service-oriented architecture (SOA) to provide a streamlined interface to their business processes. To scale up the system, each tier in a composite service ...