20 search results - page 3 / 4 » Soft Error Hardening for Asynchronous Circuits |
ISQED
2009
IEEE
14 years 1 months ago
2009
IEEE
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
DSN
2008
IEEE
14 years 22 days ago
2008
IEEE
Many classes of applications are inherently tolerant to errors. One such class are applications designed for a human end user, where the capabilities of the human cognitive system...
DAC
2004
ACM
14 years 7 months ago
2004
ACM
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
DAC
2006
ACM
14 years 7 months ago
2006
ACM
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
DSN
2005
IEEE
13 years 12 months ago
2005
IEEE
1 In sub-micron technology circuits high integration levels coupled with the increased sensitivity to soft errors even at ground level make the task of guaranteeing systems’ depe...