Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Aggressive CMOS scaling will make future chip multiprocessors (CMPs) increasingly susceptible to transient faults, hard errors, manufacturing defects, and process variations. Exis...
This paper investigates randomization and replication as strategies to achieve reliable performance in disk arrays targeted for video-on-demand (VoD) workloads. A disk array can p...
Abstract— An ad hoc wireless network is an autonomous selforganizing system of mobile nodes connected by wireless links where nodes not in direct range communicate via intermedia...
Baruch Awerbuch, David Holmer, Herbert Rubens, Rob...