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DAC
2006
ACM
16 years 6 months ago
MARS-C: modeling and reduction of soft errors in combinational circuits
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
Natasa Miskov-Zivanov, Diana Marculescu
VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
16 years 5 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
DSN
2007
IEEE
15 years 11 months ago
Utilizing Dynamically Coupled Cores to Form a Resilient Chip Multiprocessor
Aggressive CMOS scaling will make future chip multiprocessors (CMPs) increasingly susceptible to transient faults, hard errors, manufacturing defects, and process variations. Exis...
Christopher LaFrieda, Engin Ipek, José F. M...
IPPS
2007
IEEE
15 years 11 months ago
Achieving Reliable Parallel Performance in a VoD Storage Server Using Randomization and Replication
This paper investigates randomization and replication as strategies to achieve reliable performance in disk arrays targeted for video-on-demand (VoD) workloads. A disk array can p...
Yung Ryn Choe, Vijay S. Pai
INFOCOM
2005
IEEE
15 years 10 months ago
Provably competitive adaptive routing
Abstract— An ad hoc wireless network is an autonomous selforganizing system of mobile nodes connected by wireless links where nodes not in direct range communicate via intermedia...
Baruch Awerbuch, David Holmer, Herbert Rubens, Rob...