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DATE
2009
IEEE
151views Hardware» more  DATE 2009»
15 years 4 months ago
pTest: An adaptive testing tool for concurrent software on embedded multicore processors
—More and more processor manufacturers have launched embedded multicore processors for consumer electronics products because such processors provide high performance and low powe...
Shou-Wei Chang, Kun-Yuan Hsieh, Jenq Kuen Lee
ICCS
2005
Springer
15 years 3 months ago
Model-Based Statistical Testing of a Cluster Utility
Abstract. As High Performance Computing becomes more collaborative, software certification practices are needed to quantify the credibility of shared applications. To demonstrate q...
W. Thomas Swain, Stephen L. Scott
HIPC
2003
Springer
15 years 2 months ago
Thread Migration/Checkpointing for Type-Unsafe C Programs
Thread migration/checkpointing is becoming indispensable for load balancing and fault tolerance in high performance computing applications, and its success depends on the migration...
Hai Jiang, Vipin Chaudhary
ET
2002
122views more  ET 2002»
14 years 9 months ago
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
Magnus Eckersand, Fredrik Franzon, Ken Filliter
CODES
2005
IEEE
15 years 3 months ago
High-level synthesis for large bit-width multipliers on FPGAs: a case study
In this paper, we present the analysis, design and implementation of an estimator to realize large bit width unsigned integer multiplier units. Larger multiplier units are require...
Gang Quan, James P. Davis, Siddhaveerasharan Devar...