Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
In this paper, we consider the problem of maximizing the battery life (or duration of service) in battery-powered CMOS circuits. We first show that the battery efficiency (or utili...
This paper discusses the problem of increased programming time for intrinsic evolvable hardware (EHW) as the complexity of the circuit grows. We develop equations for the size of ...
Egon Börger Ambient Abstract State Machines with Applications 11:00 AM Manfred Broy Realizability of System Interface Specifications 11:30 AM Ofer Strichman Proving Equivalence be...
Abstract. Physical computational devices leak side-channel information that may, and often does, reveal secret internal states. We present a general transformation that compiles an...
Sebastian Faust, Tal Rabin, Leonid Reyzin, Eran Tr...