Statistical methods, such as independent component analysis, have been successful in learning local low-level features from natural image data. Here we extend these methods for le...
Abstract—In two recent contributions [1], [2], we have provided a comparative analysis of various optimization algorithms, which can be used for atomic location estimation, and s...
Stefano Tennina, Marco Di Renzo, Fabio Graziosi, F...
A new algorithm for identifying stuck faults in combinational circuits that cannot be detected by a given input sequence is presented. Other than pre and post-processing steps, ce...
Vishwani D. Agrawal, Soumitra Bose, Vijay Gangaram
The objective of this paper is to suggest a systematic means by which the timing and focus of information technology policies can be used to optimize supply chain performance and ...
Reliability of logic circuits is emerging as an important concern that may limit the benefits of continued scaling of process technology and the emergence of future technology al...