2286 search results - page 5 / 458 » Statistical timing analysis based on a timing yield model |
75
Voted
DATE
2010
IEEE
14 years 11 months ago
2010
IEEE
—The advanced sampling and variance reduction techniques as efficient alternatives to the slow crude-MC method have recently been adopted for the analysis of timing yield in dig...
73
Voted
DATE
2006
IEEE
15 years 5 months ago
2006
IEEE
State of the art statistical timing analysis (STA) tools often yield less accurate results when timing variables become correlated. Spatial correlation and correlation caused by p...
DATE
2010
IEEE
15 years 4 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
CORR
2007
Springer
14 years 11 months ago
2007
Springer
This paper considers a developing theory on the effects of inevitable process variations during the fabrication of MEMS and other microsystems. The effects on the performance and ...
ICCAD
2006
IEEE
15 years 8 months ago
2006
IEEE
Statistical static timing analysis (SSTA) is emerging as a solution for predicting the timing characteristics of digital circuits under process variability. For computing the stat...