Most applications accessible through the Web suffer from a noticeable lack of support for adapting to the different information needs that different users may have regarding a cert...
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...
: We present a Built-In Self-Test (BIST)-based diagnostic approach for the programmable interconnect resources in Field Programmable Gate Arrays (FPGAs) that can be used for either...
Charles E. Stroud, Jeremy Nall, Matthew Lashinsky,...
Two of the most critical requirementsin support of producing reliableface-recognition systems are a large database of facial images and a testing procedure to evaluate systems. Th...
P. Jonathon Phillips, Hyeonjoon Moon, Patrick J. R...
Testing has a vital support role in the software engineering process, but developing tests often takes significant resources. A formal specification is a repository of knowledge a...