3527 search results - page 86 / 706 » Test Automation in Practice |
ICWE
2005
Springer
15 years 3 months ago
2005
Springer
: Web-portal application development needs to be improved by comprehensive testing processes and practices. Building the initial knowledge by evaluating and improving the state of ...
TCAD
2008
14 years 9 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
AGILEDC
2005
IEEE
15 years 3 months ago
2005
IEEE
Most significant software processes involve a wide range of disciplines, from programming to testing, and from documentation to database development. Unfortunately, agile processe...
KDD
2000
ACM
15 years 1 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
MMSEC
2006
ACM
15 years 3 months ago
2006
ACM
Two different approaches for constructing a steganographic channel in an IEEE 802.11 (WLAN) network are introduced in this paper. First test results on the reliability, undetectab...