1422 search results - page 10 / 285 » Test Generation Algorithms Based on Preorder Relations |
DATE
1997
IEEE
15 years 1 months ago
1997
IEEE
A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IVconverter macro design....
65
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DATE
2005
IEEE
15 years 3 months ago
2005
IEEE
Abstract: With the increasing complexity of memory behavior, attempts are being made to come up with a methodical approach that employs electrical simulation to tackle the memory t...
117
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PTS
2010
14 years 7 months ago
2010
We present a novel algorithm for test data generation that is based on techniques used in formal software verification. Prominent examples of such formal techniques are symbolic ex...
GECCO
2005
Springer
15 years 3 months ago
2005
Springer
As the paradigm of object orientation becomes more and more important for modern IT development projects, the demand for an automated test case generation to dynamically test obje...
CEC
2007
IEEE
15 years 4 months ago
2007
IEEE
— Recent large scale experiments have shown that the Normalized Information Distance, an algorithmic information measure, is among the best similarity metrics for melody classiï¬...