203 search results - page 24 / 41 » Test Pattern Generator for Delay Faults |
106
click to vote
ISQED
2007
IEEE
15 years 8 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
121
click to vote
VLSID
2005
IEEE
15 years 7 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
DAC
2000
ACM
15 years 6 months ago
2000
ACM
Real defects (e.g. stuck-at or bridging faults) in the VLSI circuits cause intermediate voltages and can not be modeled as ideal shorts. In this paper we first show that the trad...
134
click to vote
EVOW
2001
Springer
15 years 6 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
89
Voted
DAC
1996
ACM
15 years 6 months ago
1996
ACM
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...