203 search results - page 9 / 41 » Test Pattern Generator for Delay Faults |
ET
2006
14 years 9 months ago
2006
An ATPG for resistive bridging faults is proposed that combines the advantages of section-based generation and interval-based simulation. In contrast to the solutions introduced s...
DATE
2002
IEEE
15 years 2 months ago
2002
IEEE
Test sets for path delay faults in circuits with large numbers of paths are typically generated for path delay faults associated with the longest circuit paths. We show that such ...
JOLPE
2008
14 years 9 months ago
2008
JISE
2000
14 years 9 months ago
2000
We present an algorithm for identifyinga set of faults that do not have to be targeted by a sequential delay fault test generator. These faults either cannot independently aect th...
ATS
2003
IEEE
15 years 2 months ago
2003
IEEE
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...