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FM
1998
Springer
198views Formal Methods» more  FM 1998»
15 years 5 months ago
Automated Test Set Generation for Statecharts
Kirill Bogdanov, Mike Holcombe, Harbhajan Singh
GLVLSI
1997
IEEE
92views VLSI» more  GLVLSI 1997»
15 years 5 months ago
An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation
H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor V...
INFOCOM
1996
IEEE
15 years 5 months ago
Context Independent Unique Sequences Generation for Protocol Testing
T. Ramalingom, Krishnaiyan Thulasiraman, Anindya D...
ITC
1996
IEEE
78views Hardware» more  ITC 1996»
15 years 5 months ago
Identification and Test Generation for Primitive Faults
Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakrad...