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VLSID
1995
IEEE
112views VLSI» more  VLSID 1995»
15 years 5 months ago
An efficient automatic test generation system for path delay faults in combinational circuits
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
VLSID
1995
IEEE
107views VLSI» more  VLSID 1995»
15 years 5 months ago
Functional test generation for non-scan sequential circuits
Mandyam-Komar Srinivas, James Jacob, Vishwani D. A...
DAC
1991
ACM
15 years 5 months ago
A Transitive Closure Based Algorithm for Test Generation
Srimat T. Chakradhar, Vishwani D. Agrawal
ITC
1994
IEEE
136views Hardware» more  ITC 1994»
15 years 5 months ago
An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...