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search results - page 112 / 1171
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Test generation and minimization with
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VLSID
1995
IEEE
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VLSI
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An efficient automatic test generation system for path delay faults in combinational circuits
15 years 5 months ago
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Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
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VLSID
1995
IEEE
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VLSI
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VLSID 1995
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Functional test generation for non-scan sequential circuits
15 years 5 months ago
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Mandyam-Komar Srinivas, James Jacob, Vishwani D. A...
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DAC
1991
ACM
95
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Computer Architecture
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DAC 1991
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A Transitive Closure Based Algorithm for Test Generation
15 years 5 months ago
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Srimat T. Chakradhar, Vishwani D. Agrawal
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ICTAI
1994
IEEE
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Artificial Intelligence
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ICTAI 1994
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GATTO: An Intelligent Tool for Automatic Test Pattern Generation for Digital Circuits
15 years 5 months ago
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Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
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89
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ITC
1994
IEEE
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Hardware
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ITC 1994
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An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
15 years 5 months ago
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Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
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