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116
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ET
2002
15 years 1 months ago
2002
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
126
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TASE
2009
IEEE
15 years 8 months ago
2009
IEEE
The complex interactions appearing in service-oriented computing make coordination a key concern in serviceoriented systems. In this paper, we present a fault-based method to gene...
106
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COMPSAC
2005
IEEE
15 years 7 months ago
2005
IEEE
Automatic test data generation leads to the identification of input values on which a selected path or a selected branch is executed within a program (path-oriented vs goalorient...
103
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ICCAD
1998
IEEE
15 years 5 months ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
DATE
2006
IEEE
15 years 7 months ago
2006
IEEE
Generation of n -detection test sets is typically done for a single fault model. In this work we investigate the generation of n -detection test sets by pairing each fault of a ta...