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DAC
1997
ACM
15 years 5 months ago
Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
Oriol Roig, Jordi Cortadella, Marco A. Peña...
HASE
2007
IEEE
15 years 5 months ago
Model Validation using Automatically Generated Requirements-Based Tests
In current model-based development practice, validation that we are building a correct model is achieved by manually deriving requirements-based test cases for model testing. Mode...
Ajitha Rajan, Michael W. Whalen, Mats Per Erik Hei...
TAP
2010
Springer
126views Hardware» more  TAP 2010»
15 years 6 months ago
DyGen: Automatic Generation of High-Coverage Tests via Mining Gigabytes of Dynamic Traces
Unit tests of object-oriented code exercise particular sequences of method calls. A key problem when automatically generating unit tests that achieve high structural code coverage ...
Suresh Thummalapenta, Jonathan de Halleux, Nikolai...
VTS
1997
IEEE
105views Hardware» more  VTS 1997»
15 years 5 months ago
Critical hazard free test generation for asynchronous circuits
We describe a technique to generate critical hazard-free tests for self-timed control circuits build using a macromodule library, in a partial scan based DFT environment. Wepropos...
Ajay Khoche, Erik Brunvand
DAC
2009
ACM
16 years 2 months ago
Generating test programs to cover pipeline interactions
Functional validation of a processor design through execution of a suite of test programs is common industrial practice. In this paper, we develop a high-level architectural speci...
Thanh Nga Dang, Abhik Roychoudhury, Tulika Mitra, ...