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ET
2002
15 years 1 months ago
2002
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
120
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ASPDAC
1998
ACM
15 years 5 months ago
1998
ACM
— Test Pattern Generation for combinational circuits entails the identification of primary input assignments for detecting each fault in a set of target faults. An extension to ...
137
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FLOPS
2010
Springer
15 years 8 months ago
2010
Springer
We present a general framework for generating SQL query test cases using Constraint Logic Programming. Given a database schema and a SQL view defined in terms of other views and s...
110
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GECCO
2009
Springer
15 years 8 months ago
2009
Springer
The critical functionality of many software applications relies on code that performs mathematically complex computations. However, such code is often difficult to test owing to t...
DATE
2000
IEEE
15 years 5 months ago
2000
IEEE
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...