112 search results - page 21 / 23 » Test generation in VLSI circuits for crosstalk noise |
85
Voted
ITC
1997
IEEE
15 years 4 months ago
1997
IEEE
- An all-digital technique for the measurement of the jitter transfer function of charge-pump phase-locked loops is introduced. Input jitter may be generated using one of two metho...
91
Voted
ICCAD
2007
IEEE
15 years 9 months ago
2007
IEEE
Abstract— This paper addresses the module assignment problem in pinlimited designs under the stacked-Vdd circuit paradigm. A partition-based algorithm is presented for efficient...
DAC
2002
ACM
16 years 1 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
104
click to vote
JETC
2008
14 years 11 months ago
2008
With aggressive reductions in feature sizes and the integration of multiple functionalities on the same die, bottlenecks due to I/O pin limitations have become a severe issue in to...
105
click to vote
DFT
2008
IEEE
15 years 6 months ago
2008
IEEE
Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capabilit...