502 search results - page 22 / 101 » Test pattern generation based on arithmetic operations |
120
click to vote
ET
2002
15 years 1 months ago
2002
In this paper we present a new reseeding technique for test-per-clock test pattern generation suitable for at-speed testing of circuits with random-pattern resistant faults. Our te...
116
click to vote
SSPR
2000
Springer
15 years 5 months ago
2000
Springer
In the field of pattern recognition, the concept of Multiple Classifier Systems (MCSs) was proposed as a method for the development of high performance classification systems. At p...
124
click to vote
IFL
2005
Springer
15 years 7 months ago
2005
Springer
Polytypic functional programming has the advantage that it can derive code for generic functions automatically. However, it is not clear whether it is useful for anything other tha...
93
Voted
ITC
2000
IEEE
15 years 6 months ago
2000
IEEE
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
140
click to vote
DBPL
2005
Springer
15 years 7 months ago
2005
Springer
Pattern matching mechanisms based on regular expressions feature in a number of recent languages for processing XML. The flexibility of these mechanisms demands novel approaches ...