502 search results - page 24 / 101 » Test pattern generation based on arithmetic operations |
105
click to vote
CDC
2009
IEEE
15 years 8 months ago
2009
IEEE
— Due to the uncertainty in the forecasting of load patterns, security dispatching finds the generation pattern, which is the most economic and passes all N − 1 contingencies ...
167
Voted
SEKE
2005
Springer
15 years 9 months ago
2005
Springer
This paper presents a state-based approach to testing aspect-oriented programs. Aspectual state models, as an extension to the testable FREE state model of classes, are exploited ...
125
Voted
ASPDAC
2007
ACM
15 years 7 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
114
Voted
ITC
1997
IEEE
15 years 7 months ago
1997
IEEE
This paper proposes an environment to address Testability Analysis and Test Pattern Generation on VHDL descriptions at the RT-level. The proposed approach, based on a suitable fau...
126
Voted
GECCO
2003
Springer
15 years 8 months ago
2003
Springer
Learning Bayesian networks from data has been studied extensively in the evolutionary algorithm communities [Larranaga96, Wong99]. We have previously explored extending some of the...