83 search results - page 8 / 17 » Test point insertion based on path tracing |
ITC
1996
IEEE
15 years 3 months ago
1996
IEEE
A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test...
ITC
1997
IEEE
15 years 3 months ago
1997
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points and on IDD switching transients on the sup...
VLSID
2004
IEEE
16 years 1 days ago
2004
IEEE
Recent research for testable designs has focussed on inserting test structures by re-arranging an Register-TransferLevel (RTL) data path generated from a behavioural description t...
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CSMR
2010
IEEE
14 years 6 months ago
2010
IEEE
Abstract--Building comprehensive test suites for web applications poses new challenges in software testing. Coverage criteria used for traditional systems to assess the quality of ...
VC
2010
14 years 10 months ago
2010
In this paper we propose a novel technique to perform real-time rendering of translucent inhomogeneous materials, one of the most well known problems of Computer Graphics. The deve...