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» Test set compaction algorithms for combinational circuits
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GECCO
2008
Springer
112views Optimization» more  GECCO 2008»
15 years 5 months ago
Handling dynamic data structures in search based testing
There has been little attention to search based test data generation in the presence of pointer inputs and dynamic data structures, an area in which recent concolic methods have e...
Kiran Lakhotia, Mark Harman, Phil McMinn
GD
2006
Springer
15 years 8 months ago
Planarity Testing and Optimal Edge Insertion with Embedding Constraints
The planarization method has proven to be successful in graph drawing. The output, a combinatorial planar embedding of the so-called planarized graph, can be combined with state-o...
Carsten Gutwenger, Karsten Klein, Petra Mutzel
BMCBI
2011
14 years 11 months ago
Statistical Test of Expression Pattern (STEPath): a new strategy to integrate gene expression data with genomic information in i
Background: In the last decades, microarray technology has spread, leading to a dramatic increase of publicly available datasets. The first statistical tools developed were focuse...
Paolo G. V. Martini, Davide Risso, Gabriele Sales,...
ICCAD
2004
IEEE
114views Hardware» more  ICCAD 2004»
16 years 1 months ago
Simultaneous short-path and long-path timing optimization for FPGAs
This paper presents the Routing Cost Valleys (RCV) algorithm – the first published algorithm that simultaneously optimizes all short- and long-path timing constraints in a Field...
Ryan Fung, Vaughn Betz, William Chow
DSN
2005
IEEE
15 years 10 months ago
Effective Testing and Debugging Techniques for a Group Communication System
View-oriented group communication is an important and widely used building block for constructing highlyavailable fault-tolerant systems. Unfortunately, groupcommunication based s...
Eitan Farchi, Gabriel Kliot, Yoel Krasny, Alex Kri...