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85
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ET
2007
69views more  ET 2007»
15 years 10 days ago
Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST
Abstract In order to perform an on-chip test for characterizing both static and transmission parameters of embedded analog-to-digital converters (ADCs), this paper presents an osci...
Hsin-Wen Ting, Cheng-Wu Lin, Bin-Da Liu, Soon-Jyh ...
93
Voted
ICSE
2007
IEEE-ACM
16 years 14 days ago
Compatibility and Regression Testing of COTS-Component-Based Software
Software engineers frequently update COTS components integrated in component-based systems, and can often chose among many candidates produced by different vendors. This paper tac...
Leonardo Mariani, Mauro Pezzè, Sofia Papagi...
98
Voted
JOC
2011
104views more  JOC 2011»
14 years 3 months ago
On the Security of Oscillator-Based Random Number Generators
Physical random number generators (a.k.a. TRNGs) appear to be critical components of many cryptographic systems. Yet, such building blocks are still too seldom provided with a form...
Mathieu Baudet, David Lubicz, Julien Micolod, Andr...
FORTE
2004
15 years 1 months ago
Generation of Integration Tests for Self-Testing Components
Internet software tightly integrates classic computation with communication software. Heterogeneity and complexity can be tackled with a component-based approach, where components ...
Leonardo Mariani, Mauro Pezzè, David Willmo...
80
Voted
ICCAD
1999
IEEE
72views Hardware» more  ICCAD 1999»
15 years 4 months ago
Validation and test generation for oscillatory noise in VLSI interconnects
: Inductance of on-chip interconnects gives rise to signal overshoots and undershoots that can cause logic errors. By considering technology trends, we show that in 0.13
Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer