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» Test suite reduction and prioritization with call trees
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104
Voted
KDD
2009
ACM
173views Data Mining» more  KDD 2009»
16 years 1 months ago
The offset tree for learning with partial labels
We present an algorithm, called the offset tree, for learning in situations where a loss associated with different decisions is not known, but was randomly probed. The algorithm i...
Alina Beygelzimer, John Langford
82
Voted
ICIP
2001
IEEE
16 years 2 months ago
Algorithmic modifications to SPIHT
This paper proposes several low complexity algorithmic modifications to the SPIHT (Set Partitioning in Hierarchical Trees) image coding method of [3]. The modifications exploit un...
Ulug Bayazit, William A. Pearlman
ICSE
1994
IEEE-ACM
15 years 4 months ago
TestTube: A System for Selective Regression Testing
This paper describes a system called TESTTUBE that combines static and dynamic analysis to perform selective retesting of software systems written in C. TESTTUBEfirst identifies w...
Yih-Farn Chen, David S. Rosenblum, Kiem-Phong Vo
105
Voted
ITC
2003
IEEE
170views Hardware» more  ITC 2003»
15 years 5 months ago
Double-Tree Scan: A Novel Low-Power Scan-Path Architecture
In a scan-based system with a large number of flip-flops, a major component of power is consumed during scanshift and clocking operation in test mode. In this paper, a novel scan-...
Bhargab B. Bhattacharya, Sharad C. Seth, Sheng Zha...
PASTE
2004
ACM
15 years 5 months ago
Mock object creation for test factoring
Test factoring creates fast, focused unit tests from slow systemwide tests; each new unit test exercises only a subset of the functionality exercised by the system tests. Augmenti...
David Saff, Michael D. Ernst