1610 search results - page 104 / 322 » Testing Patterns |
113
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SIGMOD
2010
ACM
15 years 7 months ago
2010
ACM
Mining graph patterns in large networks is critical to a variety of applications such as malware detection and biological module discovery. However, frequent subgraphs are often i...
118
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ICCAD
2007
IEEE
15 years 11 months ago
2007
IEEE
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...
ETS
2007
IEEE
15 years 8 months ago
2007
IEEE
This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests a...
93
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ITC
2000
IEEE
15 years 6 months ago
2000
IEEE
We present the application of a deterministic logic BIST scheme on state-of-the-art industrial circuits. Experimental results show that complete fault coverage can be achieved for...
ATS
2009
IEEE
15 years 9 months ago
2009
IEEE
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compa...