1610 search results - page 114 / 322 » Testing Patterns |
146
Voted
DATE
2010
IEEE
15 years 7 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
100
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VTS
2003
IEEE
15 years 7 months ago
2003
IEEE
Reseeding is used to improve fault coverage in pseudo-random testing. Most of the work done on reseeding is based on storing the seeds in an external tester. Besides its high cost...
102
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ICCV
1999
IEEE
16 years 4 months ago
1999
IEEE
The paper describes a scheme for detecting vehicles in images. The proposed method approximately models the unknown distribution of the images of vehicles by learning higher order...
109
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ISQED
2010
IEEE
15 years 7 months ago
2010
IEEE
— This paper proposes a two-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping many l...
108
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DDECS
2008
IEEE
15 years 9 months ago
2008
IEEE
— Due to ever increasing design sizes more efficient tools for Automatic Test Pattern Generation (ATPG) are needed. Recently ATPG based on Boolean satisfiability (SAT) has been ...