1610 search results - page 126 / 322 » Testing Patterns |
144
Voted
BMCBI
2006
15 years 2 months ago
2006
Background: Traditional methods of analysing gene expression data often include a statistical test to find differentially expressed genes, or use of a clustering algorithm to find...
123
Voted
DFT
2008
IEEE
15 years 9 months ago
2008
IEEE
Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capabilit...
114
Voted
TCAD
2002
15 years 2 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
119
Voted
DAC
2003
ACM
16 years 3 months ago
2003
ACM
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...
124
Voted
PRIS
2004
15 years 4 months ago
2004
Abstract. Feature selection researchers often encounter a peaking phenomenon: a feature subset can be found that is smaller but still enables building a more accurate classifier th...