1610 search results - page 68 / 322 » Testing Patterns |
102
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ICVGIP
2004
15 years 3 months ago
2004
This paper proposes a person identification system (PID), which works with non-illumination low-resolution eye images. Radial-Scan and threshold methods are used for Iris normaliz...
103
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FPL
2004
Springer
15 years 7 months ago
2004
Springer
Abstract. We present an evaluation of accelerating fault simulation by hardware emulation on FPGA. Fault simulation is an important subtask in test pattern generation and it is fre...
DAC
2009
ACM
16 years 3 months ago
2009
ACM
The discrepancy between integrated circuits' activities in normal functional mode and that in structural test mode has an increasing adverse impact on the effectiveness of ma...
124
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VTS
1998
IEEE
15 years 6 months ago
1998
IEEE
This paper presents a BIST architecture for Finite State Machines that exploits Cellular Automata (CA) as pattern generators and signature analyzers. The main advantage of the pro...
102
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DATE
2002
IEEE
15 years 7 months ago
2002
IEEE
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...