1610 search results - page 82 / 322 » Testing Patterns |
107
Voted
DAC
2007
ACM
16 years 3 months ago
2007
ACM
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
125
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ICES
2000
Springer
15 years 5 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
106
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ASPDAC
1998
ACM
15 years 6 months ago
1998
ACM
−This paper describes a new redundant fault identification algorithm with Exclusive-OR circuit reduction. The experimental results using this algorithm with a FAN-based test patt...
145
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BMCBI
2007
15 years 2 months ago
2007
Background: Identification of protein interacting sites is an important task in computational molecular biology. As more and more protein sequences are deposited without available...
121
Voted
SAC
2004
ACM
15 years 7 months ago
2004
ACM
In this paper, we demonstrate that the performance of a motif discovery algorithm can be significantly improved by embedding it into a novel framework that effectively guides the ...